MIT Engineers Develop Groundbreaking Computer Vision Method for Characterizing Electronic Materials
MIT engineers have developed a groundbreaking computer vision method for rapid characterization of electronic material properties, significantly outpacing traditional approaches. This innovative technique aims to expedite the discovery of superior electronic materials for applications such as solar cells, transistors, LEDs, and batteries. The method accelerates the characterization process by an impressive 85 times, revolutionizing the evaluation of freshly synthesized electronic materials.
The Future of AI in Business
My company recently celebrated 44 years in business and yet we are only at the beginning of a whole new reinvention. In fact, I foresee AI bringing a new dawn for many business leaders. I’ve learned that in this new…